CONTRAST OF A P-N-JUNCTION IN ULTRA HIGH-VACUUM SCANNING ELECTRON-MICROSCOPY

被引:0
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作者
DURAUD, JP
LEMOEL, A
LEGRESSUS, C
PANTEL, R
CHORNIK, B
机构
[1] CNET, CNS, F-38240 MEYLAN, FRANCE
[2] UNIV SIMON BOLIVAR, DEPT CIENCIA MAT, CARACAS, VENEZUELA
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暂无
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TH742 [显微镜];
学科分类号
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页码:49 / 54
页数:6
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