CONTRAST OF A p-n JUNCTION IN ULTRA HIGH VACUUM SCANNING ELECTRON MICROSCOPY.

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作者：
Duraud, J.P.
Le Moel, A.
Le Gressus, C.
Pantel, R.
Chornik, B.
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来源：
Scanning Electron Microscopy | 1984年 / v卷 / pt 1 1984期
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摘要：
MICROSCOPES, ELECTRON
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页码：49 / 54
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