CMOS STUCK-OPEN FAULT MODELING, DETECTION AND SIMULATION

被引：0

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作者：

WU, DM

HSIEH, EP

机构：

来源：

1989 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-3 | 1989年

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TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

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页码：379 / 383

页数：5

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