CMOS STUCK-OPEN FAULT MODELING, DETECTION AND SIMULATION

被引：0
|
作者：
WU, DM
HSIEH, EP
机构：
来源：
1989 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-3 | 1989年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：379 / 383
页数：5
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