DETERMINATION OF THE CONCENTRATION OF CHARGED IMPURITIES IN SILICON BY THE ELECTROREFLECTION METHOD

被引：0
|
作者：
BEGISHEV, AR
GALIEV, GB
KAPAEV, VV
MOKEROV, VG
机构：
来源：
SOVIET PHYSICS SEMICONDUCTORS-USSR | 1982年 / 16卷 / 03期
关键词：
D O I：
暂无
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
引用
收藏
页码：270 / 273
页数：4
相关论文
共 50 条
  • [21] Determination of impurities in silicon nitride and silicon carbide by microwave digestion
    Tanimoto, M
    Fukumura, H
    BUNSEKI KAGAKU, 1996, 45 (04) : 357 - 361
  • [22] EXTRACTIVE CONCENTRATION FOR DETERMINATION OF IMPURITIES IN CAUSTIC SODA
    KUZMIN, NM
    DUBROVIN.TP
    SHEMSHUK, OM
    INDUSTRIAL LABORATORY, 1969, 35 (07): : 938 - &
  • [23] ELECTROREFLECTION SPECTRA OF IMPLANTATION-DOPED SILICON
    ALMAZOV, LA
    GAVRILENKO, VI
    ZUEV, VA
    LITOVCHENKO, VG
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1978, 12 (08): : 913 - 917
  • [24] SPECTROGRAPHIC DETERMINATION OF TRACE IMPURITIES IN SILICON TETRACHLORIDE
    LARIN, NV
    SHISHOV, VN
    KRYLOV, VA
    MISHINA, EI
    JOURNAL OF ANALYTICAL CHEMISTRY OF THE USSR, 1976, 31 (11): : 1606 - 1610
  • [25] DETERMINATION OF IMPURITIES IN SILICON-CARBIDE POWDERS
    DOCEKAL, B
    BROEKAERT, JAC
    GRAULE, T
    TSCHOPEL, P
    TOLG, G
    FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1992, 342 (1-2): : 113 - 117
  • [26] DETERMINATION OF IMPURITIES IN SILICON BY NEUTRON ACTIVATION ANALYSIS
    KANT, A
    CALI, JP
    THOMPSON, HD
    ANALYTICAL CHEMISTRY, 1956, 28 (12) : 1867 - 1871
  • [27] SPECTROGRAPHIC DETERMINATION OF TRACE AMOUNTS OF IMPURITIES IN SILICON
    VIVARATPERRIN, J
    BONNIER, E
    CHIMIE ANALYTIQUE, 1966, 48 (09): : 511 - +
  • [28] CHOICE OF METHOD FOR DETERMINATION OF SILICON CONCENTRATION IN NATURAL WATERS OF DIFFERENT TYPES
    Kambalina, M. G.
    Pikula, N. P.
    Guseva, N. V.
    IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII KHIMIYA I KHIMICHESKAYA TEKHNOLOGIYA, 2014, 57 (11): : 15 - +
  • [29] Detection Limit of Photoluminescence Method for Determination of Carbon Impurity Concentration in Silicon
    Satake, Yuta
    Tajima, Michio
    Asahara, Shota
    Ogura, Atsushi
    6TH IEEE ELECTRON DEVICES TECHNOLOGY AND MANUFACTURING CONFERENCE (EDTM 2022), 2022, : 220 - 222
  • [30] CHARGED IMPURITIES CONCENTRATION WAVES IN HEII AS TYPE OF SECOND SOUND WAVES
    PETRU, ZK
    PHYSICS LETTERS A, 1972, A 39 (05) : 361 - &
12345