A BUILT-IN SELF TEST TECHNIQUE FOR DIGITAL CIRCUITS

被引：0
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作者：
FASANG, PP
机构：
来源：
SIEMENS FORSCHUNGS-UND ENTWICKLUNGSBERICHTE-SIEMENS RESEARCH AND DEVELOPMENT REPORTS | 1982年 / 11卷 / 02期
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
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页码：65 / 68
页数：4
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