OBSERVATION OF POTENTIAL BARRIER IN CUPROUS-OXIDE RECTIFIER WITH SCANNING ELECTRON-MICROSCOPY USING BEAM INDUCED CURRENT

被引：5
|
作者：
MIZUGUCHI, J [1 ]
机构：
[1] SONY CORP RES CTR,HODOGAYA KU,YOKOHAMA 240,JAPAN
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS | 1976年 / 15卷 / 05期
关键词：
D O I：
10.1143/JJAP.15.907
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：907 / 908
页数：2
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