OBSERVATION OF POTENTIAL BARRIER IN CUPROUS-OXIDE RECTIFIER WITH SCANNING ELECTRON-MICROSCOPY USING BEAM INDUCED CURRENT

被引：5

作者：

MIZUGUCHI, J ^{[1
]}

机构：

[1] SONY CORP RES CTR,HODOGAYA KU,YOKOHAMA 240,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1976年 / 15卷 / 05期

关键词：

D O I：

10.1143/JJAP.15.907

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：907 / 908

页数：2

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