DETECTION OF MULTIPLE STUCK-ON STUCK-OPEN FAULTS BY SINGLE FAULTS TEST SETS IN MOS-TRANSISTOR NETWORKS

被引：0

作者：

DARLAY, F ^{[1
]}

机构：

[1] SWISS FED INST TECHNOL,ELECTR RES LABS,LEG EL ECUBLENS,CH-1015 LAUSANNE,SWITZERLAND

来源：

MICROPROCESSING AND MICROPROGRAMMING | 1991年 / 32卷 / 1-5期

关键词：

D O I：

10.1016/0165-6074(91)90437-X

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The present paper is a theoretical study of multiple stuck-on/stuck-open faults in MOS transistor networks. We show that, under two conditions, the detection of all single faults of a transistor network implies the detection of all multiple faults of the network. Several examples of applications are given, which induce a sensible increase of the test efficiency.

引用

页码：783 / 790

页数：8

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