DETECTION OF MULTIPLE STUCK-ON STUCK-OPEN FAULTS BY SINGLE FAULTS TEST SETS IN MOS-TRANSISTOR NETWORKS

被引：0
|
作者：
DARLAY, F [1 ]
机构：
[1] SWISS FED INST TECHNOL,ELECTR RES LABS,LEG EL ECUBLENS,CH-1015 LAUSANNE,SWITZERLAND
来源：
MICROPROCESSING AND MICROPROGRAMMING | 1991年 / 32卷 / 1-5期
关键词：
D O I：
10.1016/0165-6074(91)90437-X
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
The present paper is a theoretical study of multiple stuck-on/stuck-open faults in MOS transistor networks. We show that, under two conditions, the detection of all single faults of a transistor network implies the detection of all multiple faults of the network. Several examples of applications are given, which induce a sensible increase of the test efficiency.
引用
收藏
页码：783 / 790
页数：8
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