共 50 条
- [34] EXPLOITING DOMAIN KNOWLEDGE IN IC CELL LAYOUT IEEE DESIGN & TEST OF COMPUTERS, 1984, 1 (03): : 52 - 64
- [36] Estimation of the IC layout sensitivity to spot defects Electron Technol (Warsaw), 1 (182-190):
- [37] NEW APPROACHES TO IC LAYOUT PRESENTED AT SRC CONFERENCE IEEE DESIGN & TEST OF COMPUTERS, 1985, 2 (03): : 84 - 86
- [38] A layout-to-simulation approach for thermal design of IC PROCEEDINGS OF THE TWENTIETH INTERSOCIETY CONFERENCE ON THERMAL AND THERMOMECHANICAL PHENOMENA IN ELECTRONIC SYSTEMS (ITHERM 2021), 2021, : 584 - 588
- [39] GRAPHICAL LAYOUT SYSTEM FOR IC-MASK DESIGN IEEE TRANSACTIONS ON CIRCUIT THEORY, 1971, CT18 (01): : 163 - &