Atomic-scale studies of point defects in compound semiconductors by scanning tunneling microscopy

被引：9

作者：

Gwo, S ^{[1
]}

Miwa, S ^{[1
]}

Ohno, H ^{[1
]}

Fan, JF ^{[1
]}

Tokumoto, H ^{[1
]}

机构：

[1] JOINT RES CTR ATOM TECHNOL,NATL INST ADV INTERDISCIPLINARY RES,TSUKUBA,IBARAKI 305,JAPAN

来源：

ICDS-18 - PROCEEDINGS OF THE 18TH INTERNATIONAL CONFERENCE ON DEFECTS IN SEMICONDUCTORS, PTS 1-4 | 1995年 / 196-卷

关键词：

point defect; dopant impurity; vacancy; defect cluster; compound semiconductor; scanning tunneling microscopy;

D O I：

10.4028/www.scientific.net/MSF.196-201.1949

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We report direct observation of individual dopant impurities (Si-Ga in GaAs, S-As in InAs) and Ga surface vacancies (V-Ga) on the (110) cleavage surfaces of m-V compounds. In the scanning tunneling microscopy images at low sample bias voltages, the charged dopants and surface vacancies exhibit the delocalized feature seen as protrusions or depressions extended over several lattice sites on the (110) face. This approach opens up new opportunities for studying individual defects in compound semiconductors on the atomic scale.

引用

页码：1949 / 1953

页数：5

共 50 条

[41] ATOMIC-SCALE MODIFICATIONS OF GAAS USING A SCANNING TUNNELING MICROSCOPE
MORIARTY, P
BETON, PH
WOOLF, DA
APPLIED PHYSICS LETTERS, 1995, 66 (12) : 1515 - 1517
[42] WRITING AND DELETING ATOMIC-SCALE STRUCTURES WITH THE SCANNING TUNNELING MICROSCOPE
SCHIMMEL, T
KEMNITZER, R
KUPPERS, J
FUCHS, H
LUXSTEINER, M
THIN SOLID FILMS, 1995, 254 (1-2) : 147 - 152
[43] Atomic force microscopy and scanning tunneling microscopy studies of AlCl3-graphite intercalation compound
Ikemiya, N
Shimazu, E
Hara, S
Shioyama, H
Sawada, Y
CARBON, 1996, 34 (02) : 277 - 279
[44] Atomic force microscopy and scanning tunneling microscopy studies of AlCl3-graphite intercalation compound
Osaka Univ, Suita, Japan
Carbon, 2 (277-279):
[45] ATOMIC-SCALE VIEW OF ALGAAS/GAAS HETEROSTRUCTURES WITH CROSS-SECTIONAL SCANNING-TUNNELING-MICROSCOPY
JOHNSON, MB
MAIER, U
MEIER, HP
SALEMINK, HWM
APPLIED PHYSICS LETTERS, 1993, 63 (09) : 1273 - 1275
[46] Theory of Atomic-Scale Direct Thermometry Using Electron Spin Resonance via Scanning Tunneling Microscopy
del Castillo, Yelko
Fernandez-Rossier, Joaquin
NANO LETTERS, 2025, 25 (06) : 2159 - 2165
[47] In Situ Observation of Atomic-Scale Growth of a NaCl Thin Crystal on Au(111) by Scanning Tunneling Microscopy
Katano, Satoshi
Uehara, Yoichi
JOURNAL OF PHYSICAL CHEMISTRY C, 2020, 124 (37): : 20184 - 20192
[48] NANOMETER-SCALE SYNTHESIS AND ATOMIC-SCALE MODIFICATION WITH THE SCANNING TUNNELING MICROSCOPE
PENNER, RM
SCANNING MICROSCOPY, 1993, 7 (03) : 805 - 813
[49] ATOMIC-SCALE VIEW OF ALGAAS/GAAS MULTILAYERS WITH CROSS-SECTIONAL SCANNING-TUNNELING-MICROSCOPY
JOHNSON, MB
MAIER, U
MEIER, HP
SALEMINK, H
JOURNAL OF CRYSTAL GROWTH, 1993, 127 (1-4) : 1077 - 1082
[50] Atomic-scale mapping of electronic structures across heterointerfaces by cross-sectional scanning tunneling microscopy
Chiu, Ya-Ping
Huang, Bo-Chao
Shih, Min-Chuan
Huang, Po-Cheng
Chen, Chun-Wei
JOURNAL OF PHYSICS-CONDENSED MATTER, 2015, 27 (34)

← 1 2 3 4 5 →