MIGRATION OF INTERSTITIALS IN SILICON

被引:173
作者
BARAFF, GA
SCHLUTER, M
机构
来源
PHYSICAL REVIEW B | 1984年 / 30卷 / 06期
关键词
D O I
10.1103/PhysRevB.30.3460
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:3460 / 3469
页数:10
相关论文
共 36 条
[1]   PSEUDOPOTENTIALS THAT WORK - FROM H TO PU [J].
BACHELET, GB ;
HAMANN, DR ;
SCHLUTER, M .
PHYSICAL REVIEW B, 1982, 26 (08) :4199-4228
[2]   STRUCTURAL-ENERGY CALCULATIONS BASED ON NORM-CONSERVING PSEUDOPOTENTIALS AND LOCALIZED GAUSSIAN-ORBITALS [J].
BACHELET, GB ;
GREENSIDE, HS ;
BARAFF, GA ;
SCHLUTER, M .
PHYSICAL REVIEW B, 1981, 24 (08) :4745-4752
[3]   CLUSTER-EXTENDED GREENS-FUNCTION FOR ELECTRONIC-STRUCTURE OF LOCALIZED DEFECTS IN SOLIDS [J].
BARAFF, GA ;
SCHLUTER, M ;
ALLAN, G .
PHYSICAL REVIEW B, 1983, 27 (02) :1010-1016
[4]   SELF-CONSISTENT GREENS FUNCTION CALCULATION OF IDEAL SI VACANCY [J].
BARAFF, GA ;
SCHLUTER, M .
PHYSICAL REVIEW LETTERS, 1978, 41 (13) :892-895
[5]   THEORY OF THE SILICON VACANCY - AN ANDERSON NEGATIVE-U SYSTEM [J].
BARAFF, GA ;
KANE, EO ;
SCHLUTER, M .
PHYSICAL REVIEW B, 1980, 21 (12) :5662-5686
[6]   CALCULATION OF THE TOTAL ENERGY OF CHARGED POINT-DEFECTS USING THE GREENS-FUNCTION TECHNIQUE [J].
BARAFF, GA ;
SCHLUTER, M .
PHYSICAL REVIEW B, 1984, 30 (04) :1853-1866
[7]   TOTAL ENERGY OF ISOLATED POINT-DEFECTS IN SOLIDS [J].
BARAFF, GA ;
SCHLUTER, M .
PHYSICAL REVIEW B, 1983, 28 (04) :2296-2298
[8]   COMPARISON BETWEEN THE ADSPACE AND CLUSTER-EXTENDED GREEN-FUNCTION TECHNIQUES FOR LOCALIZED DEFECTS [J].
BARAFF, GA ;
SCHLUTER, M .
PHYSICAL REVIEW B, 1984, 30 (06) :3456-3459
[9]   THEORY OF ENHANCED MIGRATION OF INTERSTITIAL ALUMINUM IN SILICON [J].
BARAFF, GA ;
SCHLUTER, M ;
ALLAN, G .
PHYSICAL REVIEW LETTERS, 1983, 50 (10) :739-742
[10]  
BARAFF GA, UNPUB