MIGRATION OF INTERSTITIALS IN SILICON

被引:173
作者
BARAFF, GA
SCHLUTER, M
机构
来源
PHYSICAL REVIEW B | 1984年 / 30卷 / 06期
关键词
D O I
10.1103/PhysRevB.30.3460
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:3460 / 3469
页数:10
相关论文
共 36 条
[11]  
BARAFF GA, 1981, 11TH P INT C DEF RAD, P287
[12]  
BARYAM Y, COMMUNICATION
[13]  
BOURGOIN J, 1981, SPRINGER SERIES SOLI, V22
[14]  
BOURGOIN J, 1981, SPRINGER SERIES SOLI, V35
[15]  
CORBETT JW, 1975, POINT DEFECTS SOLIDS, V2, P103
[16]  
CORBETT JW, 1966, SOLID STATE PHYSICS, V7, P89
[17]  
DELEO GG, COMMUNICATION
[18]   NORM-CONSERVING PSEUDOPOTENTIALS [J].
HAMANN, DR ;
SCHLUTER, M ;
CHIANG, C .
PHYSICAL REVIEW LETTERS, 1979, 43 (20) :1494-1497
[19]   SEMICONDUCTOR CHARGE-DENSITIES WITH HARD-CORE AND SOFT-CORE PSEUDOPOTENTIALS [J].
HAMANN, DR .
PHYSICAL REVIEW LETTERS, 1979, 42 (10) :662-665
[20]  
KIMERLING LC, 1979, 1978 P INT C DEF RAD, P56