TEM STUDY OF INTERDIFFUSION AND INTERFACES IN MO/PD/SI THIN-FILMS

被引：4
|
作者：
SINGH, RN
KOCH, EF
机构：
来源：
JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1986年 / 133卷 / 06期
关键词：
D O I：
10.1149/1.2108817
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
引用
收藏
页码：1191 / 1195
页数：5
相关论文
共 50 条
  • [31] THIN-FILMS AND INTERFACES - MODELING AND CHARACTERIZATION
    PAINE, DC
    JOM-JOURNAL OF THE MINERALS METALS & MATERIALS SOCIETY, 1995, 47 (03): : 30 - 30
  • [32] THIN-FILMS, INTERFACES, AND NONCLASSICAL SPECTROSCOPY
    BOHN, PW
    PROGRESS IN ANALYTICAL SPECTROSCOPY, 1989, 12 (01): : 41 - 72
  • [33] XPS STUDY OF SIO THIN-FILMS AND SIO METAL INTERFACES
    NGUYEN, TP
    LEFRANT, S
    JOURNAL OF PHYSICS-CONDENSED MATTER, 1989, 1 (31) : 5197 - 5204
  • [34] SILANE SILICIDATION OF MO THIN-FILMS
    CHOW, TP
    BROWN, DM
    STECKL, AJ
    GARFINKEL, M
    JOURNAL OF APPLIED PHYSICS, 1980, 51 (11) : 5981 - 5985
  • [35] REACTION OF AI/MO THIN-FILMS
    KITADA, M
    SHIMIZU, N
    JOURNAL OF MATERIALS SCIENCE, 1984, 19 (04) : 1339 - 1342
  • [36] SILICIDE FORMATION IN MO THIN-FILMS AND SI SINGLE-CRYSTAL INTERACTIONS
    BOUABELLOU, A
    HALIMI, R
    BECHIRI, A
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1993, (130): : 335 - 338
  • [37] INTERDIFFUSION AND CHEMICAL ORDERING IN COMPOSITION-MODULATED FE70SI30 SI AMORPHOUS THIN-FILMS
    BRUSON, A
    PIECUCH, M
    MARCHAL, G
    JOURNAL OF APPLIED PHYSICS, 1985, 58 (03) : 1229 - 1233
  • [38] Hydrogen absorption in Pd thin-films
    Ramos de Debiaggi, S.
    Crespo, E. A.
    Braschi, F. U.
    Bringa, E. M.
    Ali, M. L.
    Ruda, M.
    INTERNATIONAL JOURNAL OF HYDROGEN ENERGY, 2014, 39 (16) : 8590 - 8595
  • [39] SURFACE-STRUCTURE OF EPITAXIAL PD2SI THIN-FILMS
    OURA, K
    OKADA, S
    KISHIKAWA, Y
    HANAWA, T
    APPLIED PHYSICS LETTERS, 1982, 40 (02) : 138 - 140
  • [40] INVESTIGATION OF NISI AND PD3SI THIN-FILMS BY AES AND XPS
    ATZRODT, V
    WIRTH, T
    LANGE, H
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1980, 62 (02): : 531 - 537
12345