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- [36] Distribution profile of deep levels in SiC observed by isothermal capacitance transient spectroscopy SILICON CARBIDE AND RELATED MATERIALS 2001, PTS 1 AND 2, PROCEEDINGS, 2002, 389-3 : 851 - 854
- [37] Observation of deep levels in SiC by optical-isothermal capacitance transient spectroscopy SILICON CARBIDE AND RELATED MATERIALS - 1999 PTS, 1 & 2, 2000, 338-3 : 757 - 760