Evaluation of Laser-Electron X-ray Source and Related Optics for X-ray Diffractometry and Topography

被引：2
|
作者：
Polyakov, S. N. [1 ]
Artyukov, I. A. [1 ]
Blank, V. D. [1 ]
Zholudev, S. I. [1 ]
Feshchenko, R. M. [2 ]
Popov, N. L. [2 ]
Yaroslavtsev, A. A. [1 ]
Vinogradov, A. V. [2 ]
机构：
[1] Technol Inst Superhard & Novel Carbon Mat, 7a Tsentralnaya St, Moscow 108840, Russia
[2] PN Lebedev Phys Inst RAS, 53 Leninskiy Prospekt, Moscow 119991, Russia
来源：
X-RAY LASERS AND COHERENT X-RAY SOURCES: DEVELOPMENT AND APPLICATIONS | 2017年 / 10243卷
关键词：
X-ray diffraction; Thomson scattering; laser-electron X-ray source; X-ray optics; MONOCHROMATOR; BEAMLINE;
D O I：
10.1117/12.2264976
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A new type of a high-brilliance X-ray source known as the Thomson X-ray laser-electron generator (TXG) opens new possibilities for materials characterization by X-ray diffraction methods such as high resolution X-ray diffractometry and topography and diffraction analysis at extreme conditions in shear diamond anvil cells. The advantages of the TXG compared to X-ray laboratory sources are a high flux, a quasi-monochromatic, nearly parallel beam and a tunable wavelength. The paper presents examples of applications as well as estimations of typical photon flux and exposure time saving advantages resulted from an implementation of TXG radiation in a home laboratory.
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页数：8
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