Evaluation of Laser-Electron X-ray Source and Related Optics for X-ray Diffractometry and Topography

被引：2

作者：

Polyakov, S. N. ^{[1
]}

Artyukov, I. A. ^{[1
]}

Blank, V. D. ^{[1
]}

Zholudev, S. I. ^{[1
]}

Feshchenko, R. M. ^{[2
]}

Popov, N. L. ^{[2
]}

Yaroslavtsev, A. A. ^{[1
]}

Vinogradov, A. V. ^{[2
]}

机构：

[1] Technol Inst Superhard & Novel Carbon Mat, 7a Tsentralnaya St, Moscow 108840, Russia

[2] PN Lebedev Phys Inst RAS, 53 Leninskiy Prospekt, Moscow 119991, Russia

来源：

X-RAY LASERS AND COHERENT X-RAY SOURCES: DEVELOPMENT AND APPLICATIONS | 2017年 / 10243卷

关键词：

X-ray diffraction; Thomson scattering; laser-electron X-ray source; X-ray optics; MONOCHROMATOR; BEAMLINE;

D O I：

10.1117/12.2264976

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new type of a high-brilliance X-ray source known as the Thomson X-ray laser-electron generator (TXG) opens new possibilities for materials characterization by X-ray diffraction methods such as high resolution X-ray diffractometry and topography and diffraction analysis at extreme conditions in shear diamond anvil cells. The advantages of the TXG compared to X-ray laboratory sources are a high flux, a quasi-monochromatic, nearly parallel beam and a tunable wavelength. The paper presents examples of applications as well as estimations of typical photon flux and exposure time saving advantages resulted from an implementation of TXG radiation in a home laboratory.

引用

页数：8

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