Evaluation of Laser-Electron X-ray Source and Related Optics for X-ray Diffractometry and Topography

被引：2

作者：

Polyakov, S. N. ^{[1
]}

Artyukov, I. A. ^{[1
]}

Blank, V. D. ^{[1
]}

Zholudev, S. I. ^{[1
]}

Feshchenko, R. M. ^{[2
]}

Popov, N. L. ^{[2
]}

Yaroslavtsev, A. A. ^{[1
]}

Vinogradov, A. V. ^{[2
]}

机构：

[1] Technol Inst Superhard & Novel Carbon Mat, 7a Tsentralnaya St, Moscow 108840, Russia

[2] PN Lebedev Phys Inst RAS, 53 Leninskiy Prospekt, Moscow 119991, Russia

来源：

X-RAY LASERS AND COHERENT X-RAY SOURCES: DEVELOPMENT AND APPLICATIONS | 2017年 / 10243卷

关键词：

X-ray diffraction; Thomson scattering; laser-electron X-ray source; X-ray optics; MONOCHROMATOR; BEAMLINE;

D O I：

10.1117/12.2264976

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new type of a high-brilliance X-ray source known as the Thomson X-ray laser-electron generator (TXG) opens new possibilities for materials characterization by X-ray diffraction methods such as high resolution X-ray diffractometry and topography and diffraction analysis at extreme conditions in shear diamond anvil cells. The advantages of the TXG compared to X-ray laboratory sources are a high flux, a quasi-monochromatic, nearly parallel beam and a tunable wavelength. The paper presents examples of applications as well as estimations of typical photon flux and exposure time saving advantages resulted from an implementation of TXG radiation in a home laboratory.

引用

页数：8

共 50 条

[21] X-RAY OPTICS + X-RAY MICROANALYSIS
HEINRICH, KF
AMERICAN SCIENTIST, 1965, 53 (03) : A382 - &
[22] X-RAY OPTICS AND X-RAY MICROANALYSIS
WERNER
METALL, 1966, 20 (05): : 550 - &
[23] X-RAY OPTICS AND X-RAY MICROANALYSIS
SANDS, DE
MICROCHEMICAL JOURNAL, 1965, 9 (01) : 100 - &
[24] X-RAY OPTICS AND X-RAY MICROANALYSIS
AXON, HJ
JOURNAL OF THE INSTITUTE OF METALS, 1965, 93 : 607 - &
[25] X-RAY OPTICS AND X-RAY ASTRONOMY
KANTOR, FW
TRANSACTIONS OF THE NEW YORK ACADEMY OF SCIENCES, 1968, 30 (08): : 1100 - &
[26] CHARACTERIZATION OF BIPHASE DENDRITIC ALLOYS BY X-RAY TOPOGRAPHY AND X-RAY-DIFFRACTOMETRY
RAPPAZ, M
BLANK, E
HELVETICA PHYSICA ACTA, 1982, 55 (02): : 163 - 164
[27] Capillary optics for real time X-ray diffractometry
Bjeoumikhov, A.
Bjeoumikhova, S.
Langhoff, N.
Wolff, H.
JOURNAL OF X-RAY SCIENCE AND TECHNOLOGY, 2005, 13 (04) : 185 - 190
[28] SCANNING SOURCE X-RAY TOPOGRAPHY
MILNE, AD
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1971, 4 (JUN1) : 251 - &
[29] MINIATURE X-RAY POINT SOURCE FOR ALIGNMENT AND CALIBRATION OF X-RAY OPTICS
PRICE, RH
BOYLE, MJ
GLAROS, SS
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1977, 22 (09): : 1196 - 1196
[30] X-ray microscope with refractive X-ray optics and microfocus laboratory source
Serebrennikov, D. A.
Dudchik, Yu. I.
Barannikov, A. A.
Klimova, N. B.
Snigirev, A. A.
ADVANCES IN LABORATORY-BASED X-RAY SOURCES, OPTICS, AND APPLICATIONS VI, 2017, 10387

← 1 2 3 4 5 →