A 0.23 mW, On-Chip, Self-Calibrating RF Amplitude Detector in 65 nm CMOS

被引：0

作者：

Kifle, Yonatan ^{[1
]}

Alhawari, Mohammad ^{[1
]}

Bou-Sleiman, Sleiman ^{[2
]}

Ismail, Mohammed ^{[1
]}

机构：

[1] Khalifa Univ Sci Technol & Res, KSRC, Abu Dhabi, U Arab Emirates

[2] Intel Corp, Phoenix, AZ 85226 USA

来源：

2016 IEEE 59TH INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS) | 2016年

关键词：

Amplitude detector; built-in-self-test (BiST); detection error; RF detector and variability compensation;

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

We present an RF amplitude detector with a conversion gain of -3 V/V for RF amplitude range 0 to 0.6 V-p in 65nm CMOS. On-chip self-calibration structure that automatically corrects the variations within the RF detector itself is proposed. Silicon measurement results show the self-calibration structure improves the detection error of the non-calibrated RF amplitude detector to less than 10% at only 0.23mW power consumption.

引用

页码：759 / 762

页数：4

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