A 0.23 mW, On-Chip, Self-Calibrating RF Amplitude Detector in 65 nm CMOS

被引：0
|
作者：
Kifle, Yonatan [1 ]
Alhawari, Mohammad [1 ]
Bou-Sleiman, Sleiman [2 ]
Ismail, Mohammed [1 ]
机构：
[1] Khalifa Univ Sci Technol & Res, KSRC, Abu Dhabi, U Arab Emirates
[2] Intel Corp, Phoenix, AZ 85226 USA
来源：
2016 IEEE 59TH INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS (MWSCAS) | 2016年
关键词：
Amplitude detector; built-in-self-test (BiST); detection error; RF detector and variability compensation;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
We present an RF amplitude detector with a conversion gain of -3 V/V for RF amplitude range 0 to 0.6 V-p in 65nm CMOS. On-chip self-calibration structure that automatically corrects the variations within the RF detector itself is proposed. Silicon measurement results show the self-calibration structure improves the detection error of the non-calibrated RF amplitude detector to less than 10% at only 0.23mW power consumption.
引用
收藏
页码：759 / 762
页数：4
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