Multiple-Event Direct to Histogram TDC in 65nm FPGA Technology

被引:0
|
作者
Dutton, Neale [1 ,2 ]
Vergote, Johannes [1 ,2 ]
Gnecchi, Salvatore [1 ,2 ]
Grant, Lindsay [1 ]
Lee, David [1 ]
Pellegrini, Sara [1 ]
Rae, Bruce [1 ]
Henderson, Robert [2 ]
机构
[1] ST Microelect Imaging Div, Edinburgh, Midlothian, Scotland
[2] Univ Edinburgh, Edinburgh, Midlothian, Scotland
关键词
TIME; SENSOR;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel multiple-event Time to Digital Converter (TDC) with direct to histogram output is implemented in a 65nm Xilinx Virtex 5 FPGA. The delay-line based architecture achieves 16.3 ps temporal accuracy over a 2.86ns dynamic range. The measured maximum conversion rate of 6.17 Gsamples/s and the sampling rate of 61.7 Gsamples/s are the highest published in the literature. The system achieves a linearity of -0.9/+3 LSB DNL and -1.5/+5 LSB INL. The TDC is demonstrated in a direct time of flight optical ranging application with 12mm error over a 350mm range.
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页数:5
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