共 50 条
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- [28] EUV mask blank readiness for 45nm HP 2009 manufacturing Emerging Lithographic Technologies IX, Pts 1 and 2, 2005, 5751 : 178 - 189
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- [30] Immersion defectivity study with volume production immersion lithography tool for 45 nm node and below OPTICAL MICROLITHOGRAPHY XXI, PTS 1-3, 2008, 6924