A highly reliable butterfly PUF in SRAM-based FPGAs

被引：17

作者：

Xu, Xiumin ^{[1
]}

Liang, Huaguo ^{[1
]}

Huang, Zhengfeng ^{[1
]}

Jiang, Cuiyun ^{[2
]}

Ouyang, Yiming ^{[3
]}

Fang, Xiangsheng ^{[4
]}

Ni, Tianming ^{[1
]}

Yi, Maoxiang ^{[1
]}

机构：

[1] Hefei Univ Technol, Sch Elect Sci & Appl Phys, 193 Tunxi Rd, Hefei 230009, Anhui, Peoples R China

[2] Hefei Univ Technol, Sch Math, 193 Tunxi Rd, Hefei 230009, Anhui, Peoples R China

[3] Hefei Univ Technol, Sch Comp & Informat, 193 Tunxi Rd, Hefei 230009, Anhui, Peoples R China

[4] Anhui Inst Econ Management, Dept Informat Project, 115 Wangjiang Rd, Hefei 230051, Anhui, Peoples R China

来源：

IEICE ELECTRONICS EXPRESS | 2017年 / 14卷 / 14期

基金：

中国国家自然科学基金;

关键词：

physically unclonable function (PUF); SRAM-based FPGAs; delay difference test; selective mapping; highly reliable; IDENTIFICATION GENERATOR;

D O I：

10.1587/elex.14.20170551

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a butterfly physically unclonable function (PUF) implementation in SRAM-based field programmable gate arrays (FPGAs). To avoid output instability, we propose a delay difference test to identify reliable slices (mapped to which butterfly PUF cells are highly reliable) and then PUF reliability is significantly improved by selective mapping PUF cells to reliable slices, which is validated in experimental results.

引用

页码：1 / 6

页数：6

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