共 50 条
- [33] Electromigration behavior of Cu/Sn3.0Ag0.5Cu/Cu ball grid array solder joints Journal of Materials Science: Materials in Electronics, 2019, 30 : 6224 - 6233
- [39] Effects of β-Sn grain c-axis on electromigration behavior in BGA Sn3.0Ag0.5Cu solder interconnects Journal of Materials Science: Materials in Electronics, 2017, 28 : 10785 - 10793
- [40] Effects of bump size on deformation and fracture behavior of Sn3.0Ag0.5Cu/Cu solder joints during shear testing MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2011, 529 : 468 - 478