Single-electron pass-transistor logic with multiple tunnel junctions and its hybrid circuit with MOSFETs

被引:2
|
作者
Cho, YK [1 ]
Jeong, YH
机构
[1] ETRI, Basic Res Lab, Taejon, South Korea
[2] POSTECH, Dept Elect & Elect Engn, Pohang, South Korea
关键词
multiple-tunnel junction; single-electron transistor; pass-transistor logic; hybrid circuit;
D O I
10.4218/etrij.04.0204.0022
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
To improve the operation error caused by the thermal fluctuation of electrons, we propose a novel single-electron pass-transistor logic circuit employing a multiple-tunnel junction (MTJ) scheme and modulate a parameters of an MTJ single-electron tunneling device (SETD) such as the number of tunnel junctions, tunnel resistance, and voltage gain. The operation of a 3-MTJ inverter circuit is simulated at 15 K with parameters C-g=CT=Cclk=1 aF R(T=)5 MOmega, V-clk=40 mV and V-in =20 m V Using the SETD/MOSFET hybrid circuit, the charge state output of the proposed MTJ-SETD logic is successfully translated to the voltage state logic.
引用
收藏
页码:669 / 672
页数:4
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