Flip-Flop Upsets From Single-Event-Transients in 65 nm Clock Circuits

被引：12

作者：

Wissel, Larry ^{[1
]}

Heidel, David F. ^{[2
]}

Gordon, Michael S. ^{[2
]}

Rodbell, Kenneth P. ^{[2
]}

Stawiasz, Kevin ^{[2
]}

Cannon, Ethan H. ^{[1
]}

机构：

[1] IBM Corp, Syst & Technol Grp, Essex Jct, VT 05452 USA

[2] IBM Corp, TJ Watson Res Lab, Yorktown Hts, NY 10598 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2009年 / 56卷 / 06期

关键词：

Flip-flop; single-event transient; soft error;

D O I：

10.1109/TNS.2009.2033997

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper describes upsets of 65 nm flip-flops caused by Single-Event-Transients in clock-tree circuits. The upset rate is predicted through modeling, and compared to upset rates measured on a 65 nm test chip with 15 MeV carbon ions and 148 MeV protons.

引用

页码：3145 / 3151

页数：7

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