High-resolution molecular images of rubrene single crystals obtained by frequency modulation atomic force microscopy

被引：21

作者：

Minato, Taketoshi ^{[1
]}

Aoki, Hiroto ^{[2
]}

Fukidome, Hirokazu ^{[2
]}

Wagner, Thorsten ^{[3
]}

Itaya, Kingo ^{[4
]}

机构：

[1] Tohoku Univ, Int Adv Res & Educ Org, Sendai, Miyagi 9808597, Japan

[2] Tohoku Univ, Dept Appl Chem, Grad Sch Engn, Sendai, Miyagi 9808579, Japan

[3] Univ Duisburg Essen, Ctr Nanointegrat Duisburg Essen, D-47057 Duisburg, Germany

[4] Tohoku Univ, World Premier Int Res Ctr, Adv Inst Mat Res, Aoba Ku, Sendai, Miyagi 9808577, Japan

来源：

APPLIED PHYSICS LETTERS | 2009年 / 95卷 / 09期

基金：

日本科学技术振兴机构;

关键词：

FIELD-EFFECT TRANSISTOR; CRYSTALLIZATION; TRANSPORT;

D O I：

10.1063/1.3184770

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Frequency modulation atomic force microscopy (FM-AFM) was employed to study molecular structures of rubrene single crystals in ultrahigh vacuum. Molecularly flat and extraordinarily wide terraces were extended over the width of more than a few micrometers with monomolecular steps. Molecular packing arrangements and internal structures were revealed by FM-AFM. The unit cell determined by FM-AFM was consistent with the lattice parameters of bulk crystal within the experimental error, suggesting that the surface structure of rubrene is not reconstructed. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3184770]

引用

页数：3

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