Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy

被引：11

作者：

Stevens, Sam M. ^{[1
,2
]}

Cubillas, Pablo ^{[1
]}

Jansson, Kjell ^{[2
]}

Terasaki, Osamu ^{[2
]}

Anderson, Michael W. ^{[1
]}

Wright, Paul A. ^{[3
]}

Castro, Maria ^{[3
]}

机构：

[1] Univ Manchester, Sch Chem, Ctr Nanoporous Mat, Manchester M13 9PL, Lancs, England

[2] Stockholm Univ, Arrhenius Lab, S-10691 Stockholm, Sweden

[3] Univ St Andrews, Sch Chem, St Andrews KY16 9ST, Fife, Scotland

来源：

CHEMICAL COMMUNICATIONS | 2008年 / 33期

基金：

英国工程与自然科学研究理事会;

关键词：

D O I：

10.1039/b804440f

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

The resolving power of high-resolution scanning electron microscopy was judged using topographical height data from atomic force microscopy in order to assess the technique as a tool for understanding nanoporous crystal growth.

引用

页码：3894 / 3896

页数：3

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