High-resolution molecular images of rubrene single crystals obtained by frequency modulation atomic force microscopy

被引：21
|
作者：
Minato, Taketoshi [1 ]
Aoki, Hiroto [2 ]
Fukidome, Hirokazu [2 ]
Wagner, Thorsten [3 ]
Itaya, Kingo [4 ]
机构：
[1] Tohoku Univ, Int Adv Res & Educ Org, Sendai, Miyagi 9808597, Japan
[2] Tohoku Univ, Dept Appl Chem, Grad Sch Engn, Sendai, Miyagi 9808579, Japan
[3] Univ Duisburg Essen, Ctr Nanointegrat Duisburg Essen, D-47057 Duisburg, Germany
[4] Tohoku Univ, World Premier Int Res Ctr, Adv Inst Mat Res, Aoba Ku, Sendai, Miyagi 9808577, Japan
来源：
APPLIED PHYSICS LETTERS | 2009年 / 95卷 / 09期
基金：
日本科学技术振兴机构;
关键词：
FIELD-EFFECT TRANSISTOR; CRYSTALLIZATION; TRANSPORT;
D O I：
10.1063/1.3184770
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Frequency modulation atomic force microscopy (FM-AFM) was employed to study molecular structures of rubrene single crystals in ultrahigh vacuum. Molecularly flat and extraordinarily wide terraces were extended over the width of more than a few micrometers with monomolecular steps. Molecular packing arrangements and internal structures were revealed by FM-AFM. The unit cell determined by FM-AFM was consistent with the lattice parameters of bulk crystal within the experimental error, suggesting that the surface structure of rubrene is not reconstructed. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3184770]
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页数：3
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