Systematic Modeling of On-chip Power Grids with Decaps in TSV-based 3D Chip Integration

被引:0
|
作者
Oo, Zaw Zaw [1 ]
机构
[1] ASTAR, Inst High Performance Comp, Elect & Photon Dept, Singapore 138632, Singapore
关键词
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Efficient modeling of power supply noises is crucial for a robust power supply design, especially with increase in the size of on-chip power grids due to emerging 3D chip integration technology. As the power grid is interconnected vertically by through-silicon vias (TSVs), operational currents required by each functional device in integrated circuits (ICs) are supplied through vertical power and ground TSVs, and horizontal power grids. Fast switching speed of the devices become complicated the accurate analysis of the worst ease power supply noises. In this paper, a systematic modeling of on-chip power grids with decoupling capacitors - VNCAPs - used in TSV-based chip integration technology is presented using novel equivalent decap circuit model. The equivalent circuit model will be numerically validated and integrated into an efficient modeling for impedance profile of on-chip power grids and analysis of power supply noises in TSV-based 3D chip integration technology.
引用
收藏
页码:575 / 578
页数:4
相关论文
共 50 条
  • [41] A Multitier Study on Various Stacking Topologies of TSV-Based PDN Systems Using On-Chip Decoupling Capacitor Models
    Charles, Gary
    Franzon, Paul D.
    IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2015, 5 (04): : 541 - 550
  • [42] Toward a systematic sensitivity analysis of on-chip power grids using factor analysis
    Andersson, Daniel A.
    Svensson, Lars J.
    Larsson-Edefors, Per
    2007 IEEE WORKSHOP ON SIGNAL PROPAGATION ON INTERCONNECTS, 2007, : 155 - 158
  • [43] Electrical Modelling of Temperature Distributions in On-chip Interconnects, Packaging, and 3D Integration
    Jiang, Lijun
    Xu, Chuan
    Smith, Howard
    Rubin, Barry
    Deutsch, Alina
    Caron, Alain
    2010 ASIA-PACIFIC INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY & TECHNICAL EXHIBITION ON EMC RF/MICROWAVE MEASUREMENTS & INSTRUMENTATION, 2010, : 625 - 628
  • [44] Body on-chip and 3D culture: An overview
    Klingelhutz, Aloysius John
    Gourronc, Francoise
    Chaly, Anna
    Ankrum, James
    FASEB JOURNAL, 2017, 31
  • [45] An optimised 3D topology for on-chip communications
    Viswanathan, N.
    Paramasivam, K.
    Somasundaram, K.
    INTERNATIONAL JOURNAL OF PARALLEL EMERGENT AND DISTRIBUTED SYSTEMS, 2014, 29 (04) : 346 - 362
  • [46] 3D On-Chip Memory for the Vector Architecture
    Funaya, Yusuke
    Egawa, Ryusuke
    Takizawa, Hiroyuki
    Kobayashi, Hiroaki
    2009 IEEE INTERNATIONAL CONFERENCE ON 3D SYSTEMS INTEGRATION, 2009, : 352 - 357
  • [47] Vascularized 3D Cardiac tissues On-Chip
    Akinbote, Akinola
    Sastre, Violeta Beltran
    Haase, Kristina
    JOURNAL OF VASCULAR RESEARCH, 2023, 60 (SUPP1) : 28 - 28
  • [48] 3D Network-on-Chip with on-chip DRAM: An empirical analysis for future Chip Multiprocessor
    Xu, Thomas Canhao
    Yang, Bo
    Yin, Alexander Wei
    Liljeberg, Pasi
    Tenhunen, Hannu
    World Academy of Science, Engineering and Technology, 2010, 46 : 18 - 24
  • [49] Processor and DRAM Integration by TSV-Based 3-D Stacking for Power-Aware SOCs
    Chen, Shin-Shiun
    Hsu, Chun-Kai
    Shih, Hsiu-Chuan
    Yeh, Jen-Chieh
    Wu, Cheng-Wen
    2013 18TH ASIA AND SOUTH PACIFIC DESIGN AUTOMATION CONFERENCE (ASP-DAC), 2013, : 429 - 434
  • [50] Power Noise in TSV-Based 3-D Integrated Circuits
    Savidis, Ioannis
    Kose, Selcuk
    Friedman, Eby G.
    IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2013, 48 (02) : 587 - 597