Structural analysis of interfacial strained epitaxial BiMnO3 films fabricated by chemical solution deposition

被引：3
|
作者：
Naganuma, Hiroshi [1 ]
Kovacs, Andras [2 ]
Harima, Tetsuro [1 ]
Shima, Hiromi [1 ]
Okamura, Soichiro [1 ]
Hirotsu, Yoshihiko [2 ]
机构：
[1] Tokyo Univ Sci, Dept Appl Phys, Fac Sci, Shinjuku Ku, Tokyo 1628601, Japan
[2] Osaka Univ, ISIR, Osaka 5670047, Japan
来源：
JOURNAL OF APPLIED PHYSICS | 2009年 / 105卷 / 07期
关键词：
PEROVSKITE;
D O I：
10.1063/1.3074096
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
f An interfacial epitaxial BiMnO3 layer was fabricated by chemical solution deposition on SrTiO3 (100) substrate, and the microstructure of the film was analyzed by x-ray diffraction (XRD) and cross-sectional transmission electron microscopy (TEM). The TEM observation revealed the epitaxial growth of BiMnO3 on the SrTiO3 substrate as follows: ([110] (001)) BiMnO3 parallel to[0-10] x (001) SrTiO3. XRD and TEM analyses revealed that the mismatch between the epitaxial BiMnO3 and the SrTiO3 substrate causes a distortion in lattice parameters of BiMnO3 and, consequently, a large compressive strain in the BiMnO3 layer. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3074096]
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页数：3
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