Structural analysis of interfacial strained epitaxial BiMnO3 films fabricated by chemical solution deposition

f An interfacial epitaxial BiMnO3 layer was fabricated by chemical solution deposition on SrTiO3 (100) substrate, and the microstructure of the film was analyzed by x-ray diffraction (XRD) and cross-sectional transmission electron microscopy (TEM). The TEM observation revealed the epitaxial growth of BiMnO3 on the SrTiO3 substrate as follows: ([110] (001)) BiMnO3 parallel to[0-10] x (001) SrTiO3. XRD and TEM analyses revealed that the mismatch between the epitaxial BiMnO3 and the SrTiO3 substrate causes a distortion in lattice parameters of BiMnO3 and, consequently, a large compressive strain in the BiMnO3 layer. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3074096]