Ti Capping Layer Effects in Microstructure and Magnetic Properties of Sputter-Deposited FePt Thin Film

被引:0
|
作者
Xu, Jialing [1 ]
Jia, Liyun [1 ,2 ]
Li, Chenpu [1 ]
Wang, Haosen [1 ]
Ma, Li [2 ]
Sun, Huiyuan [2 ]
Hou, Denglu [2 ]
机构
[1] Hebei Inst Architecture Civil Engn, Dept Math & Phys, Zhangjiakou 075000, Peoples R China
[2] Hebei Normal Univ, Dept Phys, Hebei Adv Thin Films Lab, Shijiazhuang 050024, Hebei, Peoples R China
基金
中国国家自然科学基金;
关键词
L1(0)-ordered structure; Magnetron sputtering; Ti capping layer; PERPENDICULAR RECORDING MEDIA; TEXTURE; FIELD;
D O I
10.1007/s10948-017-4429-2
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ti/FePt/Fe nano-thin films were fabricated by a DC facing-target magnetron sputtering method onto glass substrates at room temperature and were subsequently annealed in situ in vacuum. The impacts of the Ti capping layer on microstructural and magnetic properties of the FePt films were investigated in detail. X-ray diffraction (XRD) patterns demonstrate that the film is deposited onto glass substrates and the addition of a Ti layer forms ternary TiFePt, and binary PtTi and FeTi alloys. The results reveal refined granularity, decreased roughness, and enhanced coercivity and degree of squareness after the introduction of a Ti capping layer.
引用
收藏
页码:2207 / 2210
页数:4
相关论文
共 50 条
  • [21] MAGNETIC-PROPERTIES AND MICROSTRUCTURE OF SPUTTER-DEPOSITED HO-CO AMORPHOUS ALLOY THIN-FILMS
    SUZUKI, T
    AOYAGI, E
    ICHINOSE, H
    JOURNAL OF APPLIED PHYSICS, 1985, 57 (08) : 3595 - 3597
  • [22] Shape memory behavior and microstructure in sputter-deposited Ti-47.3 at% Ni thin films
    Sakurai, J
    Kim, JI
    Miyazaki, S
    PRICM 4: FORTH PACIFIC RIM INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND PROCESSING, VOLS I AND II, 2001, : 1509 - 1512
  • [23] Conductivity and Microstructure of Combinatorially Sputter-Deposited Ta-Ti-Al Nitride Thin Films
    O'Dea, James R.
    Holtz, Megan E.
    Legard, Anna E.
    Young, Samuel D.
    Burns, Raymond G.
    Van Wassen, Abigail R.
    Muller, David A.
    Abruna, Hector D.
    DiSalvo, Francis J.
    van Dover, R. Bruce
    Marohn, John A.
    CHEMISTRY OF MATERIALS, 2015, 27 (13) : 4515 - 4524
  • [24] Effects of Post-Annealing on the Electrical Properties of Sputter-Deposited SnO Thin-Film Transistors
    Kim, Ju-Yeon
    Bae, ByungSeong
    Yun, Eui-Jung
    SCIENCE OF ADVANCED MATERIALS, 2016, 8 (02) : 272 - 277
  • [25] Microstructure of sputter-deposited Co/Si multilayer thin films
    Fallon, JM
    Faunce, CA
    Grundy, PJ
    JOURNAL OF APPLIED PHYSICS, 2000, 88 (05) : 2400 - 2407
  • [26] Microstructural characterization of sputter-deposited Pt thin film electrode
    Lim, JE
    Jeong, JK
    Ahn, KH
    Kim, HJ
    Hwang, CS
    Park, DY
    Lee, DS
    JOURNAL OF MATERIALS RESEARCH, 2004, 19 (02) : 460 - 468
  • [27] Thickness Dependence of (001) Texture Evolution and Magnetic Properties of Sputter-Deposited FePt:MgO Nanocomposite Films
    Kim, Han Jae
    Kim, Kisoo
    Lee, Seong-Rae
    Jeung, Won Young
    IEEE TRANSACTIONS ON MAGNETICS, 2008, 44 (11) : 3535 - 3538
  • [28] Structural and chemical properties of sputter-deposited Ti-Ge-N thin films
    Sandu, CS
    Sanjinés, R
    Benkahoul, M
    Parlinska-Wojtan, M
    Lévy, F
    SURFACE & COATINGS TECHNOLOGY, 2005, 200 (5-6): : 1483 - 1488
  • [29] Cell adhesion on NiTi thin film sputter-deposited meshes
    Loger, K.
    Engel, A.
    Haupt, J.
    Li, Q.
    de Miranda, R. Lima
    Quandt, E.
    Lutter, G.
    Selhuber-Unkel, C.
    MATERIALS SCIENCE & ENGINEERING C-MATERIALS FOR BIOLOGICAL APPLICATIONS, 2016, 59 : 611 - 616
  • [30] Microstructural characterization of sputter-deposited Pt thin film electrode
    Ji-Eun Lim
    Jae Kyeong Jeong
    Kun Ho Ahn
    Hyeong Joon Kim
    Cheol Seong Hwang
    Dong-Yeon Park
    Dong-Su Lee
    Journal of Materials Research, 2004, 19 : 460 - 468