On Probability of Detection Lossless Concurrent Error Detection Based on Implications

被引:9
|
作者
Wang, Chih-Hao [1 ]
Hsieh, Tong-Yu [1 ]
机构
[1] Natl Sun Yat Sen Univ, Dept Elect Engn, Kaohsiung 804, Taiwan
关键词
Concurrent error detection (CED); implication reduction; implications; probability of error detection (P-detection); reliability; SCHEME; LEVEL;
D O I
10.1109/TCAD.2017.2740289
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In recent years, a new concurrent error detection method by using invariant relationships inside a circuit, called implications, has been proposed. Algorithms have also been developed to reduce the total number of required implications so as to minimize the incurred area overhead due to implication checking logic. This implication reduction process, however, would result in degradation on the probability of error detection (P-detection) of the method. In this paper, we analyze the impact of this issue mathematically together with illustration by a real case study. Our analytical results show that just one percent degradation on P-detection would result in millions more errors being undetected per second and thereby significant loss on reliability of the target circuit. To address this issue, we develop a new implication reduction algorithm that guarantees no loss on Pdetection. In our algorithm, the detectability of errors for each candidate implication is carefully evaluated. The evaluation results are then utilized to select the most efficient candidates for detecting all the detectable errors. We also analyze the computation and memory complexity of the proposed algorithm. The experimental results on 28 representative benchmark circuits from ISCAS'85, ISCAS'89, and ITC'99 show that the implication reduction rate of our method (92.59%) is close to that of the previous work (95.8%). Only a small number of additional implications need to be selected to guarantee no loss on P-detection.
引用
收藏
页码:1090 / 1103
页数:14
相关论文
共 50 条
  • [31] Circuit Level Concurrent Error Detection in FSMs
    Natalja Kehl
    Wolfgang Rosenstiel
    Journal of Electronic Testing, 2013, 29 : 185 - 192
  • [32] REGISTER STACK WITH CONCURRENT ERROR DETECTION CAPABILITY
    Abugharsa, Huda
    Negrat, K.
    Maamar, Ali
    PROCEEDINGS OF THE 2ND INTERNATIONAL CONFERENCE ON ADVANCED COMPUTER THEORY AND ENGINEERING (ICACTE 2009), VOLS 1 AND 2, 2009, : 1573 - 1578
  • [33] Circuit Level Concurrent Error Detection in FSMs
    Kehl, Natalja
    Rosenstiel, Wolfgang
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2013, 29 (02): : 185 - 192
  • [34] Error Detection in Concurrent Java']Java Programs
    Hughes, Graham
    Rajan, Sreeranga P.
    Sidle, Tom
    Swenson, Keith
    ELECTRONIC NOTES IN THEORETICAL COMPUTER SCIENCE, 2006, 144 (03) : 45 - 58
  • [35] Concurrent error detection in array multipliers by BIDO
    Chen, TH
    Lee, YP
    Chen, LG
    IEE PROCEEDINGS-COMPUTERS AND DIGITAL TECHNIQUES, 1995, 142 (06): : 425 - 430
  • [36] An IDDQ sensor for concurrent timing error detection
    Knight, CG
    Singh, AD
    Nelson, VP
    1997 IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, 1997, : 281 - 289
  • [37] The distributed detection arithmetic with fading channel based on the minimum error probability
    Liu, Yingkun
    Feng, Xinxi
    Dang, Honggang
    Pan, Pingjun
    PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON INTELLIGENT SYSTEMS AND KNOWLEDGE ENGINEERING (ISKE 2007), 2007,
  • [38] Maneuver Detection Method Based on Probability Distribution Fitting of the Prediction Error
    Li, Tao
    Li, Kebo
    Chen, Lei
    JOURNAL OF SPACECRAFT AND ROCKETS, 2019, 56 (04) : 1114 - 1120
  • [39] Physical component performance degradation detection based on error probability analysis
    Walsh, Barbara
    Baldwin, Gerard
    Farrell, Ronan
    2007 IEEE 18TH INTERNATIONAL SYMPOSIUM ON PERSONAL, INDOOR AND MOBILE RADIO COMMUNICATIONS, VOLS 1-9, 2007, : 1955 - 1959
  • [40] Watermark detection based on error probability and its applications to video watermarking
    Choi, Y
    Aizawa, K
    ELECTRONICS AND COMMUNICATIONS IN JAPAN PART III-FUNDAMENTAL ELECTRONIC SCIENCE, 2004, 87 (06): : 66 - 76