Heavy ion radiation damage in double-sided silicon strip detectors

A(252)Cf fission fragment source was used to produce heavy-ion radiation damage in a double-sided silicon strip detector. It was found that a good quality fission fragment spectrum (as determined by the peak to valley ration N-L/N-V) could not be achieved for radiation incident on the p(+) face of the detector. However, for radiation incident on the n(+) face, the ratio N-L/N-V remained adequate up to an accumulated dose of similar to 4 X 10(6) fragments mm(-2). For the measurement of alphas, typical resolution deteriorated from an initial 30 keV FWHM to 50 keV FWHM at a dose of similar to 8 X 10(6) fragments mm(-2) for radiation incident on the n(+) face, and similar to 6 X 10(6) for radiation incident on the p(+) face. The interstrip resistance in one region of the n(+) face broke down completely after a relatively small radiation doses incident on that face. Further investigation of this is still required.