A Joint Diagnostic Test Generation Procedure with Dynamic Test Compaction

A complete industrial defect diagnosis flow for yield learning includes the use of diagnostic tests. Diagnostic tests improve the ability of a defect diagnosis procedure to provide accurate diagnosis results. Because of the costs involved, diagnostic test generation is carried out only for units where the results of defect diagnosis based on a fault detection test set are not accurate enough. This paper formulates the diagnostic test generation problem under this scenario with the goal of simplifying the test application process for diagnostic tests, taking into consideration that different units require different diagnostic tests. The parameters that the problem formulation targets are the numbers of diagnostic tests for the individual units, and the total number of diagnostic tests for all the units. A lower total number of diagnostic tests increases the similarity between the diagnostic test sets for the individual units. With similar diagnostic test sets, the units are partitioned into groups such that all the units in a group are tested using the same diagnostic test set. The paper describes a diagnostic test generation procedure that uses dynamic test compaction to optimize these parameters.