Test and Non-Test Cubes for Diagnostic Test Generation Based on Merging of Test Cubes

被引:0
|
作者
Pomeranz, Irith [1 ]
机构
[1] Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA
来源
2014 DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION (DATE) | 2014年
关键词
SYNCHRONOUS SEQUENTIAL-CIRCUITS; ATPG;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Test generation by merging of test cubes supports test compaction and test data compression. This paper describes a new approach to the use of test cube merging for the generation of compact diagnostic test sets. For this the paper uses the new concept of non-test cubes. While a test cube for a fault f(i0) detects the fault, a non-test cube for a fault f(i1) prevents the fault from being detected. Merging a test cube for a fault f(i0) and a non-test cube for a fault f(i1) produces a diagnostic test cube that distinguishes the two faults. The paper describes a procedure for diagnostic test generation based on merging of test and non-test cubes. Experimental results demonstrate that compact diagnostic test sets are obtained.
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