Nano-scale integrity and coherence of the SI

被引：0
|
作者：
Milton, MJT [1 ]
Cumpson, PJ [1 ]
机构：
[1] Natl Phys Lab, Ctr Opt & Analyt Measurement, Teddington TW11 OLW, Middx, England
来源：
2002 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, CONFERENCE DIGEST | 2002年
关键词：
D O I：
10.1109/CPEM.2002.1034848
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Traceable measurements at the nano-scale are usually made by establishing links to the scale of the SI base units all of winch are defined at the macro-scale. We report the results of a study into the implications of the burgeoning developments in nano-technology on the realisation of S.I. quantities at the nano-scale.
引用
收藏
页码：316 / 316
页数：1
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