Nano-scale characterization

被引：0
|
作者：
机构：
来源：
| 1600年 / Sumitomo Metal Industries Ltd, Osaka, Japan卷 / 47期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] Nano-scale characterization of oxide materials
    Klie, RF
    Browning, ND
    DEFECTS AND DIFFUSION IN CERAMICS: AN ANNUAL RETROSPECTIVE IV, 2002, 206-2 : 31 - 52
  • [2] Realization and characterization of nano-scale FinFET devices
    Kretz, J
    Dreeskornfeld, L
    Schröter, R
    Landgraf, E
    Hofmann, F
    Rösner, W
    MICROELECTRONIC ENGINEERING, 2004, 73-4 : 803 - 808
  • [3] Preparation and Characterization of Nano-scale Zinc Hydroxystannate
    Yang, Min
    Cui, Hongtao
    Chen, Huawei
    Dang, Qiong
    KEY ENGINEERING MATERIALS AND COMPUTER SCIENCE, 2011, 320 : 369 - 372
  • [4] Development and characterization of a nano-scale contrast agent
    Oeffinger, BE
    Wheatley, MA
    ULTRASONICS, 2004, 42 (1-9) : 343 - 347
  • [5] Fractal characterization of nano-scale powder agglomerates
    Manickavasagam, S
    Saltiel, C
    Mengüç, MP
    Sadowski, M
    Drozdowicz, Z
    NANOSTRUCTURE SCIENCE, METROLOGY AND TECHNOLOGY, 2002, : 160 - 167
  • [6] Synthesis and characterization of nano-scale electrochemical sensors.
    Andreu, A
    El-Kouedi, M
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2004, 228 : U806 - U806
  • [7] Design, Fabrication and Characterization of Nano-scale Plasmonic Networks
    Swillam, Mohamed A.
    Lau, Bendict
    Lin, Charles
    Helmy, Amr. S.
    PHOTONICS NORTH 2011, 2011, 8007
  • [8] Nano-scale Characterization of the Dynamics of the Chloroplast Toc Translocon
    Reddick, L. Evan
    Chotewutmontri, Prakitchai
    Crenshaw, Will
    Dave, Ashita
    Vaughn, Michael
    Bruce, Barry D.
    METHODS IN NANO CELL BIOLOGY, 2008, 90 : 365 - +
  • [9] Nano-scale Characterization of Insulator-semicon Contacts
    Gullo, F.
    Villeneuve-Faure, C.
    Le Roy, S.
    Laurent, C.
    Teyssedre, G.
    Christen, T.
    Torkvist, C.
    Hillborg, H.
    2016 IEEE INTERNATIONAL CONFERENCE ON DIELECTRICS (ICD), VOLS 1-2, 2016, : 792 - 795
  • [10] Linearity Characterization of Nano-Scale Underlap SOI MOSFETs
    Singh, Indra Vijay
    Alam, M. S.
    2013 ANNUAL IEEE INDIA CONFERENCE (INDICON), 2013,
12345