Nano-scale integrity and coherence of the SI

被引：0

作者：

Milton, MJT ^{[1
]}

Cumpson, PJ ^{[1
]}

机构：

[1] Natl Phys Lab, Ctr Opt & Analyt Measurement, Teddington TW11 OLW, Middx, England

来源：

2002 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, CONFERENCE DIGEST | 2002年

关键词：

D O I：

10.1109/CPEM.2002.1034848

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Traceable measurements at the nano-scale are usually made by establishing links to the scale of the SI base units all of winch are defined at the macro-scale. We report the results of a study into the implications of the burgeoning developments in nano-technology on the realisation of S.I. quantities at the nano-scale.

引用

页码：316 / 316

页数：1

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