Nano-scale integrity and coherence of the SI

被引：0
|
作者：
Milton, MJT [1 ]
Cumpson, PJ [1 ]
机构：
[1] Natl Phys Lab, Ctr Opt & Analyt Measurement, Teddington TW11 OLW, Middx, England
来源：
2002 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, CONFERENCE DIGEST | 2002年
关键词：
D O I：
10.1109/CPEM.2002.1034848
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Traceable measurements at the nano-scale are usually made by establishing links to the scale of the SI base units all of winch are defined at the macro-scale. We report the results of a study into the implications of the burgeoning developments in nano-technology on the realisation of S.I. quantities at the nano-scale.
引用
收藏
页码：316 / 316
页数：1
相关论文
共 50 条
  • [41] Self-elimination of phase noise in coherence scanning interferometry for nano-scale measurement
    Ma, Long
    Zhao, Yuan
    Pei, Xin
    Wu, Sen
    Yang, Feng-Yu
    MEASUREMENT, 2022, 199
  • [42] Sensitivity analysis of scanning microwave microscopy for nano-scale dopant measurements in Si
    Torigoe, Kazuhisa
    Arita, Makoto
    Motooka, Teruaki
    Journal of Applied Physics, 2012, 112 (10):
  • [43] Sensitivity analysis of scanning microwave microscopy for nano-scale dopant measurements in Si
    Torigoe, Kazuhisa
    Arita, Makoto
    Motooka, Teruaki
    JOURNAL OF APPLIED PHYSICS, 2012, 112 (10)
  • [44] Nano-scale Observation of Si Trench Sidewall Surface Morphology by AFM Technology
    Hiruta, Reiko
    Kuribayashi, Hitoshi
    Shimizu, Ryosuke
    NANOSCALE PHENOMENA IN FUNCTIONAL MATERIALS BY SCANNING PROBE MICROSCOPY, 2008, 1025
  • [45] Nano-scale morphology and hydrogenation of Si surfaces in the early phase of hydrogen annealing
    Shimizu, R.
    Kuribayashi, H.
    Hiruta, R.
    Sudoh, K.
    Iwasaki, H.
    PROCEEDINGS OF THE 17TH INTERNATIONAL VACUUM CONGRESS/13TH INTERNATIONAL CONFERENCE ON SURFACE SCIENCE/INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY, 2008, 100
  • [46] Growth of high quality Ge/Si1-xGex on nano-scale patterned Si structures
    Vanamu, G
    Datye, AK
    Zaidi, SH
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2005, 23 (04): : 1622 - 1629
  • [47] Control of SC1 wet cleaning process for nano-scale gate oxide integrity
    Lim, SW
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2003, 42 (08): : 5002 - 5009
  • [48] Theoretical bases of nano-scale devices
    Tsukada, M
    Tagami, K
    Hirose, K
    Kobayashi, N
    CAOL 2005: PROCEEDINGS OF THE 2ND INTERNATIONAL CONFERENCE ON ADVANCED OPTOELECTRONICS AND LASERS, VOL 2, 2005, : 8 - 14
  • [49] Pulse propagation in nano-scale devices
    Wulf, U
    Skalozub, VV
    MATERIALS SCIENCE & ENGINEERING C-BIOMIMETIC AND SUPRAMOLECULAR SYSTEMS, 2005, 25 (5-8): : 679 - 681
  • [50] Correcting the characteristics of a nano-scale piezomotor
    S. M. Afonin
    Russian Engineering Research, 2008, 28 (2) : 99 - 103
12345