Diagnostic test generation for arbitrary faults

被引:0
|
作者
Bhatti, Naresh K. [1 ]
Blanton, R. D. [1 ]
机构
[1] Carnegie Mellon Univ, Dept Elect & Comp Engn, 5000 Forbes Ave, Pittsburgh, PA 15213 USA
来源
2006 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2 | 2006年
关键词
fault diagnosis; VLSI testing; ATPG;
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
It is now generally accepted that the stuck-at fault model is no longer sufficient for many manufacturing test activities. Consequently, diagnostic test pattern generation based solely on distinguishing stuck-at faults is unlikely to achieve the resolution required for emerging fault types. In this work we describe a new diagnostic ATPG implementation that uses a generalized fault model. It can be easily used in arty diagnosis framework to refine diagnostic resolution for complex defects. For various types of faults that include, for example, bridge, transition, and transistor stuck-open, we show that diagnostic resolution can be significantly enhanced over a traditional diagnostic test set aimed only at stuck-at faults. Finally, we illustrate the use of our diagnostic ATPG to distinguish faults derived from a state-of-the-art diagnosis flow based on layout.
引用
收藏
页码:559 / +
页数:4
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