共 50 条
- [1] Comparative study of the GaAs (113), (115), (001), ((1)over-bar(1)over-bar(5)over-bar), ((1)over-bar(1)over-bar(3)over-bar), and (110) surfaces by atomic force microscopy, low energy electron diffraction, and reflectance anisotropy spectroscopy MICROELECTRONICS JOURNAL, 1999, 30 (4-5) : 449 - 453
- [4] EFFECTS OF LOW-ENERGY ION-BOMBARDMENT ON GAAS MOLECULAR-BEAM EPITAXY NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 59 : 332 - 335
- [5] Domain boundaries in epitaxial GaN grown on {(111)over-bar}B GaAs and GaP by molecular beam epitaxy MICROSCOPY OF SEMICONDUCTING MATERIALS 1997, 1997, (157): : 95 - 98
- [6] Comparative study of the GaAs (113), (115), (001), (1¯1¯5¯), (1¯1¯3¯), and (110) surfaces by atomic force microscopy, low energy electron diffraction, and reflectance anisotropy spectroscopy Microelectronics Journal, 30 (04): : 449 - 453
- [7] Cesium-induced reconstruction on Si(113)3×2 surface studied by low energy electron diffraction and X-ray photoelectron spectroscopy Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1997, 36 (5 A): : 2833 - 2836
- [9] Heavily carbon-doped GaAs layers prepared by low-energy ion-beam impingement during molecular beam epitaxy NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 106 (1-4): : 133 - 136