Modeling for Infrared Readout Integrated Circuit Based on Verilog-A

被引：0

作者：

Wang Xiao ^{[1
,2
,3
]}

Shi Zelin ^{[1
,3
]}

机构：

[1] Chinese Acad Sci, Shenyang Inst Automat, Shenyang 110016, Peoples R China

[2] Univ Chinese Acad Sci, Beijing 100049, Peoples R China

[3] Chinese Acad Sci, Key Lab Optoelect Informat Proc, Shenyang 110016, Peoples R China

来源：

SELECTED PAPERS FROM CONFERENCES OF THE PHOTOELECTRONIC TECHNOLOGY COMMITTEE OF THE CHINESE SOCIETY OF ASTRONAUTICS 2014, PT II | 2015年 / 9522卷

关键词：

Readout integrated circuit; Behavioral modeling; Operational amplifier; Switch; Noise;

D O I：

10.1117/12.2180101

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Infrared detectors are the core of infrared imaging systems, while readout integrated circuits are the key components of detectors. In order to grasp the performance of circuits quickly and accurately, a method of circuit modeling using Verilog-A language is proposed, which present a behavioral simulation model for the ROIC. At first, a typical capacitor trans-impedance amplifier(CTIA) ROIC unit is showed, then the two essential parts of it, operational amplifier and switch are modeled on behavioral level. The op amp model concludes these non-ideal factors, such as finite gain-bandwidth product, input and output offset, output resistance and so on. Non-deal factors that affect switches are considered in the switch behavioral model, such as rise and fall time, on-resistance and so on. At last time-domain modeling method for noise is presented, which is compared with the classical frequency domain method for difference. The analysis results shows that in the situation that noise interested bandwidth(NIBW) is more than 5MHz, the difference between the two methods leads to less than 1% if the sample rate of noise is larger 4 times of the NIBW

引用

页数：7

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