PCA based programmable path signature analysis in BIST

被引:0
|
作者
Zhang, CW [1 ]
Peng, QC [1 ]
Li, YB [1 ]
机构
[1] Univ Elect Sci & Technol China, Inst Commun & Informat Engn, Lab 140, Chengdu 610054, Peoples R China
来源
2002 INTERNATIONAL CONFERENCE ON COMMUNICATIONS, CIRCUITS AND SYSTEMS AND WEST SINO EXPOSITION PROCEEDINGS, VOLS 1-4 | 2002年
关键词
programmable cellular automata (PCA); built-in self-test (BIST); circuit under test (CUT); signature analysis (SA);
D O I
暂无
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
A novel approach of programmable cellular automata (PCA) based switch path signature analysis in built-in self-test (BIST) is presented in this paper. By taking account of the biased output bits of the circuit under test (CUT) while computing aliasing probability, we can obtain lower bound of the aliasing probability contrasting to the former methods such as linear feedback shift register (LFSR) and multiple input shift register (MISR).
引用
收藏
页码:1227 / 1229
页数:3
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