Test-point selection algorithm using small signal model for scan-based BIST

被引：0

作者：

Hu, H ^{[1
]}

Sun, YH ^{[1
]}

机构：

[1] Tsing Hua Univ, Inst Microelect, Beijing 100084, Peoples R China

来源：

ATS 2003: 12TH ASIAN TEST SYMPOSIUM, PROCEEDINGS | 2003年

关键词：

D O I：

10.1109/ATS.2003.1250877

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

A test point selection algorithm TEPSAUS (TEst-Point Selection Algorithm Using Small signal model) for scan based build-in self-test (BIST) is proposed in this paper In order to reduce the computational complexity, the algorithm uses Small Signal Model (SSM) to build recursion formulas for cost reduction functions. With the recursion functions, the cost reduction functions can be calculated efficiently.

引用

页码：507 / 507

页数：1

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