Machine learning defect properties in Cd-based chalcogenides

被引:0
|
作者
Mannodi-Kanakkithodi, Arun [1 ]
Toriyama, Michael [1 ]
Sen, Fatih G. [1 ]
Davis, Michael J. [2 ]
Klie, Robert F. [3 ]
Chan, Maria K. Y. [1 ]
机构
[1] Argonne Natl Lab, Ctr Nanoscale Mat, 9700 S Cass Ave, Argonne, IL 60439 USA
[2] Argonne Natl Lab, Chem Sci & Engn Div, 9700 S Cass Ave, Argonne, IL 60439 USA
[3] Univ Illinois, Dept Phys, Chicago, IL 60607 USA
关键词
density functional theory; machine learning; CdTe; chalcogenides; point defects;
D O I
10.1109/pvsc40753.2019.8981266
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Impurity energy levels in the band gap can have serious consequences for a semiconductor's performance as a photovoltaic absorber. Data-driven approaches can help accelerate the prediction of point defect properties in common semiconductors, and thus lead to the identification of potential deep lying impurity states. In this work, we use density functional theory (DFT) to compute defect formation energies and charge transition levels of hundreds of impurities in CdX chalcogenide compounds, where X = Te, Se or S. We apply machine learning techniques on the DFT data and develop on-demand predictive models for the formation energy and relevant transition levels of any impurity atom in any site. The trained ML models are general and accurate enough to predict the properties of any possible point defects in any Cd-based chalcogenide, as we prove by testing on a few selected defects in mixed chalcogen compounds CdTe0.5Se0.5 and CdSe0.5S0.5. The ML framework used in this work can be extended to any class of semiconductors.
引用
收藏
页码:791 / 794
页数:4
相关论文
共 50 条
  • [41] EFFICIENT CSMA/CD-BASED PROTOCOLS FOR MULTIPLE PRIORITY CLASSES
    SHARROCK, SM
    DU, DHC
    IEEE TRANSACTIONS ON COMPUTERS, 1989, 38 (07) : 943 - 954
  • [42] Software defect prediction based on weighted extreme learning machine
    Gai, Jinjing
    Zheng, Shang
    Yu, Hualong
    Yang, Hongji
    MULTIAGENT AND GRID SYSTEMS, 2020, 16 (01) : 67 - 82
  • [43] Extreme Learning Machine Based Defect Detection for Solder Joints
    Ma, Liyong
    Xie, Wei
    Zhang, Yong
    Feng, Xijia
    JOURNAL OF INTERNET TECHNOLOGY, 2020, 21 (05): : 1535 - 1543
  • [44] Machine learning-based identification of patients with a cardiovascular defect
    Nabaouia Louridi
    Samira Douzi
    Bouabid El Ouahidi
    Journal of Big Data, 8
  • [45] Additional amplifications of SERS via an optofluidic CD-based platform
    Choi, Dukhyun
    Kang, Taewook
    Cho, Hansang
    Choi, Yeonho
    Lee, Luke P.
    LAB ON A CHIP, 2009, 9 (02) : 239 - 243
  • [46] DICOM-compliant PACS with CD-based image archival
    Cox, RD
    Henri, CJ
    Rubina, RK
    Bret, PM
    MEDICAL IMAGING 1998 - PACS DESIGN AND EVALUATION: ENGINEERING AND CLINICAL ISSUES, 1998, 3339 : 135 - 142
  • [47] Machine learning-based identification of patients with a cardiovascular defect
    Louridi, Nabaouia
    Douzi, Samira
    El Ouahidi, Bouabid
    JOURNAL OF BIG DATA, 2021, 8 (01)
  • [48] A Cd-based perovskite with optical-electrical multifunctional response
    Han, Li-Jun
    Liu, Jia
    Shao, Ting
    Jia, Qiang-Qiang
    Su, Chang-Yuan
    Fu, Da-Wei
    Lu, Hai-Feng
    NEW JOURNAL OF CHEMISTRY, 2022, 46 (37) : 17928 - 17933
  • [49] Cd-based ohmic contact materials to p-ZnSe
    Kyoto Univ, Kyoto, Japan
    J Cryst Growth, 1-4 (709-713):
  • [50] Optimization of ELISA Buffers Volume for CD-Based Microfluidic Biosensors
    Farahmand, Elham
    Ibrahim, Fatimah
    Hosseini, Samira
    Rothan, Hussein A.
    Mokhtar, Mas Sahidayana
    Djordjevic, Ivan
    2014 IEEE CONFERENCE ON BIOMEDICAL ENGINEERING AND SCIENCES (IECBES), 2014, : 575 - 577