Multi-Cycle Test with Partial Observation on Scan-Based BIST Structure

被引：20

作者：

Sato, Yasuo ^{[1
]}

Yamaguchi, Hisato ^{[1
]}

Matsuzono, Makoto ^{[1
]}

Kajihara, Seiji ^{[1
]}

机构：

[1] Kyushu Inst Technol, Dept Comp Sci & Elect, Iizuka, Fukuoka 8208502, Japan

来源：

2011 20TH ASIAN TEST SYMPOSIUM (ATS) | 2011年

关键词：

BIST; multi-cycle test; multiple observation; partial observation; scan-based BIST;

D O I：

10.1109/ATS.2011.34

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Field test for reliability is usually performed with small amount of memory resource, and it requires a new technique which might be somewhat different from the conventional manufacturing tests. This paper proposes a novel technique that improves fault coverage or reduces the number of test vectors that is needed for achieving the given fault coverage on scan-based BIST structure. We evaluate a multi-cycle test method that observes the values of partial flip-flops on a chip during capture-mode. The experimental result shows that the partial observation achieves fault coverage improvement with small hardware overhead than the full observation.

引用

页码：54 / 59

页数：6

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