Snapback circuit model for cascoded NMOS ESD over-voltage protection structures

被引：6

作者：

Vassilev, V ^{[1
]}

Lorenzini, M ^{[1
]}

Jansen, P ^{[1
]}

Vashchenko, V ^{[1
]}

Yang, JJ ^{[1
]}

Concannon, A ^{[1
]}

Archer, D ^{[1
]}

Groeseneken, G ^{[1
]}

Natarajan, MI ^{[1
]}

Terbeek, M ^{[1
]}

Thijs, S ^{[1
]}

Choi, BJ ^{[1
]}

Steyaert, M ^{[1
]}

Maes, HE ^{[1
]}

机构：

[1] IMEC, B-3001 Louvain, Belgium

来源：

ESSDERC 2003: PROCEEDINGS OF THE 33RD EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE | 2003年

关键词：

D O I：

10.1109/ESSDERC.2003.1256938

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The paper presents an equivalent circuit snapback model for the ESD domain operation of merged cascoded NMOS devices. The model reflects the specific breakdown operation of the structure at different gate bias conditions. An example for optimisation of the ESD behaviour of an output driver, utilising this protection device, is presented.

引用

页码：561 / 564

页数：4

共 50 条

[21] Input over-voltage protection circuit of switching power supply based on UC3842
College of Automation, Qingdao Technological University, Qingdao 266033, China
不详
Liaoning Gongcheng Jishu Daxue Xuebao (Ziran Kexue Ban), 2007, 5 (727-730): : 727 - 730
[22] Over-Voltage Protection Research of Latent Circuit in SCOTT plus AT Traction Power Supply System
Qu, Zhijian
Guo, Liang
Liu, Yuxin
INNOVATION AND SUSTAINABILITY OF MODERN RAILWAY, 2012, : 404 - 411
[23] Over-Voltage Protection Epoxy-CNT Composites
Czubarow, Paul
Kamata, Yoshitaka
Sato, Toshiyuki
Katz, Howard
2019 INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING (ICEP 2019), 2019, : 123 - 125
[24] Transient Over-Voltage Protection in Distributed Generators Systems
Qaisieh, Lauren M.
Marar, Hazem W.
2016 THE 4TH IEEE INTERNATIONAL CONFERENCE ON SMART ENERGY GRID ENGINEERING (SEGE), 2016, : 1 - 5
[25] Characteristic Prediction of a Varistor in Over-Voltage Protection Application
Nagatomo, Kohei
Muslim, Muhammad Aziz
Tamura, Hiroki
Tanno, Koichi
Wijono
NEURAL INFORMATION PROCESSING (ICONIP 2014), PT II, 2014, 8835 : 565 - 572
[26] Highly reliable automotive integrated protection circuit for human body model ESD of+6 kV, over voltage, and reverse voltage
Cho, S.
Lee, D.
Ali, I.
Kim, S.
Pu, Y.
Yoo, S.
Lee, K.
ELECTRONICS LETTERS, 2017, 53 (13) : 843 - 844
[27] Cascoded LVTSCR with tunable holding voltage for ESD protection in bulk CMOS technology without latchup danger
Ker, MD
Chang, HH
SOLID-STATE ELECTRONICS, 2000, 44 (03) : 425 - 445
[28] A Physics-Based Model for Snapback-Type ESD Protection Devices
Yan, Xin
Mousavi, Seyed Mostafa
Shen, Li
Xu, Yang
Zhang, Wei
Bub, Sergej
Holland, Steffen
Beetner, Daryl G.
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 2023, 65 (05) : 1273 - 1281
[29] Aging of the over-voltage protection elements caused by over-voltages
Osmokrovic, P
Loncar, B
Stankovic, S
Vasic, A
MICROELECTRONICS RELIABILITY, 2002, 42 (12) : 1959 - 1966
[30] Calculation and analysis of closing over-voltage of circuit-breaker
Xu, Jian-Yuan
Meng, Tao
Lin, Xin
Li, Xue-Bin
Shenyang Gongye Daxue Xuebao/Journal of Shenyang University of Technology, 2009, 31 (03): : 247 - 251

← 1 2 3 4 5 →